一阶形式系统K~*及其完备性

模糊命题演算的形式系统L＊已经在模糊逻辑与模糊推理的结合研究中得到了成功的应用.本文考虑与系统L＊相应的一阶逻辑理论,建立了一阶形式系统K＊,并证明了这个系统的完备性.     

基于MATLAB(SIMULINK)的电弧炉电极调节系统FUZZY-PD控制器的仿真

介绍了采用MATLAB V5.2提供的模糊逻辑工具箱来设计研究电孤纺电极调节系统中的模糊－－PD控制器，讨论了在SIMULINK环境下模糊－PD控制器的参数自调速原理、结构、建立模糊控制规则库和模糊推论方法，并给出仿真结果与结论。     

醇+N-甲基哌嗪二元体系的体积性质

采用振荡管式数字密度计分别测定甲醇、乙醇、正丙醇、异丙醇、丁正醇和异丁醇与N-甲基哌嗪组成的二元体系在298.15K下的密度，计算了超额摩尔体积、超额偏摩尔体积、表观摩尔体积、偏摩尔体积等体积性质，从分子相互作用角度讨论了这些二元体系的体积性质的变化规律，为N-甲基哌嗪的开发和研究提供基础数据和信息。     

Algorithms for flattened Gaussian beams passing through apertured and unapertured paraxial ABCD optical systems

The propagation property of flattened Gaussian beams (FGBs) is studied based on the Collins formula, and analytical propagation equations for FGBs with and without an aperture are derived. It is shown that the closed-form expressions for the FGB of order N passing through paraxial ABCD optical systems without an aperture can be written as the combinations of Confluent Hyper-geometric Functions, and that the analytical equations for the FGB of order N passing through apertured paraxial ABCD optical systems may involve Error Functions. The proposed algorithms for the considered beams can save computing time, provide intuitive physical insights, and help to design optical systems. Our results are confirmed and illustrated with numerical examples.     

夫琅禾费衍射公式的一般形式

从不同的途径导出了大角度情形下亦成立的夫琅禾费衍射积分的一般形式，指出此一般形式公式是求解夫琅禾费衍射的基本公式．并通过对夫琅禾费衍射公式的级数形式的推导，揭示了傅里叶光学中“夫琅禾费衍射公式”与一般形式公式存在的差别，以及消除这种差别的措施．此外，还较详细地讨论了倾斜因子对衍射花样的影响．这对于衍射测量及深入理解夫琅禾费衍射的本质有一定的指导意义．     

平行机半在线排序问题研究(Ⅰ)

对半在线平行机排序问题的研究进展作了详细综述和进一步探讨。文章给出半在线排序问题的背景、定义、分类和求解。介绍它们定义和在不同机器环境和目标函数下半在线排序问题分类，以及第一类半在线模型的近似算法的设计及其竞争比分析。     

用于波分复用系统的多峰干涉滤光片

介绍了用于波分复用系统的多峰干涉滤光片的设计原理,提出了滤光片透射峰位置的确定方法,讨论了影响滤光片半宽度和截止度的因素,给出了滤光片的膜厚容差分析结果,表明透射率监控标准偏差在<0.5%范围内,可以得到波形良好的多峰滤光片,最后给出了实验结果.     

ROBUST GLOBAL EXPONENTIAL STABILITY OF UNCERTAIN IMPULSIVE SYSTEMS

By using the quasi-Lyapunov function, some sufficient conditions of global exponential stability for impulsive systems are established, which is the basis for the following discussion. Then, by employing Riccati inequality and Hamilton-Jacobi inequality approach, some sufficient conditions of robust exponential stability for uncertain linear/nonlinear impulsive systems are derived, respectively. Finally, some examples are given to illustrate the applications of the theory.     

Some new results on superimposed codes

A (w,r) cover‐free family is a family of subsets of a finite set such that no intersection of w members of the family is covered by a union of r others. A (w,r) superimposed code is the incidence matrix of such a family. Such a family also arises in cryptography as the concept of key distribution pattern. In the present paper, we give some new results on superimposed codes. First we construct superimposed codes from super‐simple designs which give us results better than superimposed codes constructed by other known methods. Next we prove the uniqueness of the (1,2) superimposed code of size 9 × 12, the (2,2) superimposed code of size 14 × 8, and the (2,3) superimposed code of size 30 × 10. Finally, we improve numerical values of upper bounds for the asymptotic rate of some (w,r) superimposed codes. © 2004 Wiley Periodicals, Inc.     

Comparison of two models for managing reliability growth during product design

Relying on reliability growth testing to improve system designis neither usually effective nor efficient. Instead it is importantto design in reliability. This requires models to estimate reliabilitygrowth in the design that can be used to assess whether goalreliability will be achieved within the target timescale forthe design process. Many models have been developed for analysisof reliability growth on test, but there has been much lessattention given to reliability growth in design. This paperdescribes and compares two models: one motivated by the practicalengineering process; the other by extending the reasoning ofstatistical reliability growth modelling. Both models are referencedin the recently revised edition of international standard IEC61164. However, there has been no reported evaluation of theirproperties. Therefore, this paper explores the commonalitiesand differences between these models through an assessment oftheir logic and their application to an industrial example.Recommendations are given for the use of reliability growthmodels to aid management of the design process and to informproduct development.